TR-O-0070 :1994.3.31

武部敏彦

GaAs(001)パターン基板上でのGaAs/AlGaAs 多層膜の分子線エピタクシー中のファセット成長

Abstract:Extra facet generation during molecular beam epitaxy of GaAs/AlGaAs multilayers on (001) GaAs substrates patterned with stripes running in the [110], [110], and [100] directions and having various slopes, designated as "[110] stripe", "[110] stripe", and "[100] stripe", respectively, has systematically been investigated for the first time. It has been confirmed that extra (111)A and (114)A facets generate on the [110] stripes, extra (111)B and (113)B facets on the [110] stripes, and extra (031), (011), (045), and (013) facets. on the [100] stripes, depending on the intersection angle θ of the sidewall and the substrate plane. Among them, the (114)A, (113)B, and (013) facets are important because they persist over a wide range of θ and, therefore, play a detrimental role in forming flat and uniform sidewall layers on the (001) patterned substrates. It has been made clear that no extra facets generate on the sidewalls and flat and uniform layers maintaining the initial as-etched stripe patterns can be grown for the [110] stripes with 10°≧θ, the [110] stripes with 24゜≧θ≧20°, and the [100] stripes with 19°≧θ. Extra (111)A-related facets have developed on the (111)A-related intersection of the equivalent [100] and [010] stripes, while no extra facets have developed on the (111)B-related intersection.